As a leading company in the field of electromagnetic compatibility (EMC), we offer high-precision measurements and analyses of conducted immissions
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Testing the immunity to conducted interference pulses is important to ensure that electronic devices are robust enough to withstand interference from the supply lines
The possile tests against conducted interference are manifold.
Electrical fast transient burst (EFT/B) is the term used to describe rapidly repeating pulses, which can occur when a device switches inductive loads in the power grid. The susceptibility of an electrical device to burst pulses can be tested, by connecting its supply or signal cables to a pulse generator via a coupling network.
Surges (shock waves) can be caused by switching operations or as a result of lightning strikes
and are tested using a pulse generator by coupling in the corresponding pulses.
To test for overvoltages, voltage dips and interruptions, the device is connected to a source with a defined voltage curve.
Conducted disturbances also occur in the frequency range, which are induced by high-frequency fields.
These are generated by a sine wave generator and coupled into the supply, signal and communication lines using special coupling elements.
For high-frequency interference, the wiring harness in the vehicle can act as a receiving antenna. These disturbances are transmitted to the component under investigation via the supply lines and can lead to malfunctions or functional failures. The test is carried out by inductive coupling in the frequency range from a few 10kHz up to approx. 100 MHz into the cable harness.
A wide variety of pulse-shaped interference can also occur in the vehicle electrical system,
which are caused, for example, by switching consumers on or off, voltage dips during the starting process
or regulation problems with the vehicle electrical system voltage.
Various pulse generators and sources with a defined voltage curve are used to test these effects and their impact on the component under test.
The tests within the scope of line-bound immunity serve as proof, that voltage fluctuations caused by the coupling of interference to supply or signal lines, voltage fluctuations or HF signals do not cause any damage or permanent or temporary malfunctions.
AKUVIB carries out comprehensive EMC- line-bound immission measurements for you. Our state-of-the-art facilities and experienced engineers enable us to, perform accurate EMC immunity measurements for a wide range of electronic devices and systems.
If you are looking for accredited EMC immission measurements, you have come to the right place. Contact us today to find out more about our services and how we can help you ensure the EMC compliance of your products.
Extracts from the relevant standards
- DIN EN 61000-4-4 / IEC 61000-4-4 – Burst
The test consists of pulse packets with rapidly recurring transient electrical disturbance variables (bursts) that are coupled to power supply, control and signal lines, etc. The disturbance variables are characterized by high amplitudes, short rise times, a high repetition frequency and the low energy of the transients. - DIN EN 61000-4-5 / IEC 61000-4-5 – Surge
The interference signals are transient electrical current, voltage or energy shock waves that propagate in a line or circuit. The signals are characterized by a fast rise time and a subsequent slow drop. - DIN EN 61000-4-6 / IEC 61000-4-6 – Conducted HF
This test simulates the coupling of electromagnetic RF interference to the connecting cables of the device under test. The disturbance variable is impressed as a voltage via a coupling element in sequence on all cables that are suitable for coupling and the reaction of the test object is monitored. - DIN EN 61000-4-11 / IEC 61000-4-11 & DIN EN 61000-4-34 / IEC 61000-4-34 – AC grid fluctuations
The immunity of single-phase and three-phase electrical and electronic equipment, devices and installations on the mains connection to voltage dips, short-term interruptions and voltage fluctuations is tested. - DIN EN 61000-4-29 / IEC 61000-4-29 – DC grid fluctuations
The immunity to voltage dips, short-term interruptions and voltage fluctuations of devices and systems that are supplied via a DC network is tested. - ISO 11452-4 – BCI
During this test, high-frequency signals (usual frequency range some 10 kHz to 400 MHz) are inductively induced in the cable harness of the component. Different coupling positions, different configurations of the cable harness and different signal modulations are tested. - ISO 7637-2 / ISO 7637-3 – Interference immunity Pulse
Various pulses defined in the standards are generated by a pulse generator. These are coupled directly into the supply lines during tests. For tests on signal lines, the coupling is inductive or capacitive, depending on the pulse type. - ISO 16750-2 – Electrical stresses for electrical and electronic equipment
This standard takes into account a large number of different disturbances and effects in the vehicle electrical system, which are generated by pulse generators and sources with a defined voltage curve. - The tests mentioned are also included, in some cases in a modified form, in the various automotive factory standards, e.g.:
- BMW GS 95002-2 / GS95024-3-1
- MBN 10284-2, 10284-4, 10567
- Renault / Nissan 36-00-808
- PSA B 21 7110
- VW TL 81000, VW 80000
- Ford FMC 1278, EMC-CS-2029
- GM GMW 3097
Your suitable standard not included?
You will receive an overview of our accredited tests in the area␣Accreditation with the corresponding lists of standards.
Thanks to our flexible accreditation, we can carry out accredited tests according to customer specifications and in accordance with standards.
