AKUVIB offers you a measuring station with 67KVA for the measurement of flicker and harmonic currents
| Please contact us at: |
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| +49 (0)234 / 587 - 6000 |
| emv@akuvib.de |
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Determining the effects of low-frequency conducted interference is important to ensure that electronic devices are robust enough to withstand these loads
Due to the increasing use of power electronics such as frequency converters, inverters, speed controllers, etc. the influence of low-frequency interference on both the supply network and other consumers continues to increase.
With the special test system for grid perturbations, AKUVIB is able to
measure the influence of flicker or harmonics on the supply network
and evaluate it with reference to the applicable limit values.
Such faults in the supply network can also be simulated in a targeted manner,
to test the effects on the function of your products.
The system allows immunity and immunity emission tests on AC and DC supply connections up to 1100V with a connected load of up to 67kVA.
AKUVIB can check the effects of voltage dips as well as voltage and frequency fluctuations according to various industrial, automotive and railroad standards. A wide variety of voltage profiles can also be generated with variations in amplitude and/or frequency.
If you are looking for accredited EMC measurements, you have come to the right place.
Contact us today to find out more about our services
and how we can help you ensure the EMC compliance of your products.
Auszüge der relevanten Normen
- DIN EN IEC 61000-3-2 / DIN EN 61000-3-12 – ripple currents
During ths test, the data generated by the test specimen is and acting back on the supply network are measured and evaluated.
A distinction is made between devices with an input current < 16A per conductor and those with input currents between 16A and 75A. - DIN EN 61000-3-3 / DIN EN IEC 61000-3-11 – Voltage changes, voltage fluctuations and flicker
During this test, the data generated by the test specimen is voltage fluctuations and voltage changes generated by the device under test and acting back on the supply network are measured and evaluated.
DIN EN 61000-3-3 is applied to test objects with a device input current of up to 16A per conductor. DIN EN IEC 61000-3-11 applies to devices under test with an input current of between 16A and 75A per conductor.
Your suitable standard not included?
You will receive an overview of our accredited tests in the area␣Accreditation with the corresponding lists of standards.
Thanks to our flexible accreditation, we can carry out accredited tests according to customer specifications and in accordance with standards.
